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1 192 (0,158s)

Project

Development of equipment for dynamic measurement of geometric errors of CNC machine tools using laser interferometry (TQ03000708)

The project reacts to the requirements for increasing the workpieces' dimensional, shape, and quality accuracy. The goal of the project is the design of a device based on the principle of laser interferometry, which will be implemen...

Mechanical engineering

  • 2024 - 2025
  • 2 867 tis. Kč
  • 2 341 tis. Kč
  • TA ČR
Project

Semiconductor laser sources with fiber gratings for precision laser interferometry and spectroscopy (KJB200650503)

in high precision absolute and relative laser interferometry. Vertical Cavity Surface Emitting Lasers (VCSELs) and edge emitting laser diodes with and without antireflection of the compact semiconductor laser<...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2005 - 2007
  • 1 934 tis. Kč
  • 1 934 tis. Kč
  • AV ČR
Project

Study of electron densities and spontaneous magnetic fields by means of multi-channel complex interferometry (GA19-24619S)

The proposed unique sub-picosecond plasma probing will provide a detailed picture of evolution of very fast, impossible to distinguish by other diagnostics, hydrodynamic processes in arbitrary phases of a sub-ns iodine and fs Ti:Sapphire laser

Fluids and plasma physics (including surface physics)

  • 2019 - 2022
  • 8 218 tis. Kč
  • 8 071 tis. Kč
  • GA ČR
Project

High resolution multiwavelegth absolute laser interferometry (GP102/09/P630)

The goal of the project is the fundamental research of absolute laser interferometry with semiconductor lasers. The project is oriented to the determination of methods of the stabilization of the tuning range of the las...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2009 - 2011
  • 1 092 tis. Kč
  • 1 092 tis. Kč
  • GA ČR
Project

ALISI - Centre of advanced diagnostic methods and technologies (LO1212)

, laser interferometry and spectroscopy, acquisition and processing of biosignals, cryogenics and special technologies using electron and laser beams.......

BH - Optika, masery a lasery

  • 2014 - 2018
  • 378 464 tis. Kč
  • 160 428 tis. Kč
  • MŠMT
Project

Inline Process Metrology for Laser Structuring Systems (ME10120)

interferometry and the integration into a laser beam structuring system. FurtherLaser surface structuring system with inline surface scanning system. Targeted interferometry for high-precision measurement of macro...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2010 - 2012
  • 5 884 tis. Kč
  • 2 387 tis. Kč
  • MŠMT
Project

Laser distance measurements for industrial practice (IBS2065009)

interferometry with the tuning of the laser wavelength and the non-incremental technique using modulation of the optical frequenc of the laser. One of the aims of the technique employing a continuously tuneable semiconduct...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2000 - 2004
  • 4 378 tis. Kč
  • 3 000 tis. Kč
  • AV ČR
Project

Wavelength scanning interferometry with tuneable semiconductor laser (IAB2065001)

interferometrytechnique will be applied by means of a tuneable semiconductor laser. The measuring measuring and reference beam during wavelength scanning. Tuneable extendedcavity laser diode (ECL laser) working at 633nm wi...

BH - Optika, masery a lasery

  • 2000 - 2002
  • 2 261 tis. Kč
  • 1 699 tis. Kč
  • AV ČR
Project

Detection methods for laser interferometer driven by semiconductor laser (GP102/02/P122)

of the project. A laser interferometer driven by a new Vertical-Cavity Surface-Emitting Laser of thesemiconductor laser has an incredible tuneability simply controlled by an operating-Scanning Interferometry (WS-I...

BH - Optika, masery a lasery

  • 2002 - 2004
  • 1 055 tis. Kč
  • 701 tis. Kč
  • GA ČR
Project

Advanced interferometric systems for measurement in nanotechnology (TA02010711)

The aim of the project is research and development of interferometric systems for measurement of geometrical quantities. Research exploiting previous results of laser standards of length and methodology of interferometric metrology of length...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2012 - 2016
  • 24 670 tis. Kč
  • 15 372 tis. Kč
  • TA ČR
  • 1 - 10 out of 1 192