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3 381 (0,115s) •

Project

*New contrast mechanisms in scanning electron microscope (FR-TI3/323)

*Extension of the scope of imaging modes of the scanning electron microscopes produced by the applicant of this project, namely with microscopy of slow electrons of thecrystallinic as well as electronic structure o...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2011 - 2012
    • •
  • 2 570 tis. Kč
    • •
  • 816 tis. Kč
    • •
  • MPO
Project

Automatic analysis of light and electron microscopy neuronal data (GAP202/11/0111)

analysis of 3D light microscopy (mainly confocal microscopy and two-photonmicroscopy) and 3D electron microscopy (mainly a focused ion beamscanning electron microscopy, FIB/SEM), which will segme...

IN - Informatika

  • 2011 - 2014
    • •
  • 4 444 tis. Kč
    • •
  • 4 444 tis. Kč
    • •
  • GA ČR
Project

High-tech detection systems for electron microscopy. (EG15_019/0004693)

High-tech detection systems for electron microscopy....

JB - Senzory, čidla, měření a regulace

  • 2015 - 2020
    • •
  • 37 134 tis. Kč
    • •
  • 11 049 tis. Kč
    • •
  • MPO
Project

TACOM - Development of correlative AFM and SEM/AirSEM microscope (TM03000033)

1) To innovate and commercialize new methods and state-of-art instrumentation in correlative probe-electron (AFM-SEM) microscopy. 2) To develop (HW, SW, methods), demonstrate, and promote use of the correlative AFM and SEM micro...

Applied mechanics

  • 2022 - 2025
    • •
  • 19 796 tis. Kč
    • •
  • 14 495 tis. Kč
    • •
  • TA ČR
Project

Scanning transmission electron microscopy with very slow electrons (IAA100650902)

possibilities of the scanning transmission electron microscopy with very low energy, whereScanning transmission electron microscope, usually operating at primary beam paths of elastic (EMFP) and inelastic (IMFP) scattering...

BM - Fyzika pevných látek a magnetismus

  • 2009 - 2011
    • •
  • 2 467 tis. Kč
    • •
  • 2 467 tis. Kč
    • •
  • AV ČR
Project

Contrast and detection in scanning electron microscopy (OE08012)

The project aims to increase our knowledge of the complex physical interaction mechanisms between electrons in various semiconductor materials. This should lead to: - an understanding of contrast mechanisms in Scanning Electron ...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2008 - 2010
    • •
  • 18 270 tis. Kč
    • •
  • 7 322 tis. Kč
    • •
  • MŠMT
Project

Microstructural investigation of advanced creep resisting materials for steam power plants (OC 522.60)

bude dodáno ve verzi 2 Light microscopy, transmission and scanning electron microscopy and microanalysis and image analysis are used for quantitative microstructural characterisation.......

JG - Hutnictví, kovové materiály

  • 1998 - 2003
    • •
  • 5 130 tis. Kč
    • •
  • 2 290 tis. Kč
    • •
  • MŠMT
Project

Center of electron and photonic optics (TN01000008)

The Centre unifies all the key academic and industrial players in Czechia dealing with R&D and technology transfer in electron microscopy and lithography, optical microscopy and spectroscopy, laser and fiber technologies, o...

Optics (including laser optics and quantum optics)

  • 2018 - 2022
    • •
  • 398 305 tis. Kč
    • •
  • 312 000 tis. Kč
    • •
  • TA ČR
Project

Innovative scintillation materials and compact detection units for electron microscopy (FW12010140)

The main goal of the project is the expansion of the product portfolio in the field of electron microscopy with technologically completely new detection units based on semiconductor detection sensors and the development of unique sc...

Electrical and electronic engineering

  • 2025 - 2027
    • •
  • 38 591 tis. Kč
    • •
  • 24 160 tis. Kč
    • •
  • TA ČR
Project

Ballistic electron emission microscopy and spectroscopy of InAs quantum dots prepared by different technologies (GPP102/11/P824)

Self assembled InAs quantum dots in GaAs embedded between GaAlAs barriers will be studied by ballistic electron emission microscopy and spectroscopy. On self assembled quantum dots with dimensionally same base, prepared by different...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2011 - 2015
    • •
  • 1 405 tis. Kč
    • •
  • 1 405 tis. Kč
    • •
  • GA ČR
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