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6 482 (0,128s) •

Project

Verification of the principle of zero - charging high resolution scanning electron microscopy and its applications. (GA202/96/0961)

charging scanning electron microscosspy by adapting the existing scanning low energy electron microscope (SLEEM) to the proposed method of measurement and adjustment equipping it with an electronicall...

BM - Fyzika pevných látek a magnetismus

  • 1996 - 1998
    • •
  • 1 238 tis. Kč
    • •
  • 808 tis. Kč
    • •
  • GA ČR
Project

Workplace for applications of low voltage electron microscopy on biological specimens (1QS600220501)

to create a workplace for applications of low voltage electron microscopy on biologicalThe low voltage electron microscope (LV EM) is a new type of microscope especially designed for the...

EA - Morfologické obory a cytologie

  • 2005 - 2009
    • •
  • 3 194 tis. Kč
    • •
  • 3 194 tis. Kč
    • •
  • AV ČR
Project

*New contrast mechanisms in scanning electron microscope (FR-TI3/323)

*Extension of the scope of imaging modes of the scanning electron microscopes produced by the applicant of this project, namely with microscopy of slow electrons of thecrystallinic as well as electronic st...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2011 - 2012
    • •
  • 2 570 tis. Kč
    • •
  • 816 tis. Kč
    • •
  • MPO
Project

Detection of signal electrons in scaning electron microscopy with low primary beam energies (KJB200650501)

Low energy of signal electrons, especially backscattered electrons, is the reason of lower detectors yield. While the problem of secondary electrons detection lens, efficient detection of backscattered electron...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2005 - 2007
    • •
  • 1 669 tis. Kč
    • •
  • 1 669 tis. Kč
    • •
  • AV ČR
Project

BackScattered Electrons Detection in Low Vacuum and Low Energy Scanning Electron Microscopy for the Study of True Microstructure of Live Substances (GA102/94/0677)

JJ - Ostatní materiály

  • 1994 - 1996
    • •
  • 686 tis. Kč
    • •
  • 1 113 tis. Kč
    • •
  • GA ČR
Project

Scanning transmission electron microscopy with very slow electrons (IAA100650902)

possibilities of the scanning transmission electron microscopy with very low energy, whereScanning transmission electron microscope, usually operating at primary beam paths of elastic (EMFP) and ...

BM - Fyzika pevných látek a magnetismus

  • 2009 - 2011
    • •
  • 2 467 tis. Kč
    • •
  • 2 467 tis. Kč
    • •
  • AV ČR
Project

Very Low Energy Scanning Electron Microscopy (GA102/94/1099)

JS - Řízení spolehlivosti a kvality, zkušebnictví

  • 1994 - 1995
    • •
  • 270 tis. Kč
    • •
  • 1 190 tis. Kč
    • •
  • GA ČR
Project

Examination of nanostructures by electron beam (KJB2065405)

with a complementary technique, particularly with the scanning Auger electron microscopy revealingNewly developed principale of the scanning electron microscope (SEM) with the cathode lens enables one to ...

BM - Fyzika pevných látek a magnetismus

  • 2004 - 2005
    • •
  • 902 tis. Kč
    • •
  • 902 tis. Kč
    • •
  • AV ČR
Project

Study of environmental scanning electron microscopy methods for tissue structure (GA102/97/0988)

The project deals with problems connected with a newly developing field of electron microscopy environmental scanning electron microscopy (ESEM). Attention andpressure coriditions with regard to the propag...

JA - Elektronika a optoelektronika, elektrotechnika

  • 1997 - 1999
    • •
  • 3 403 tis. Kč
    • •
  • 1 243 tis. Kč
    • •
  • GA ČR
Project

Detector of the angular distribution of the signal electrons in low energy microscope (GA102/00/P001)

-selective detection of signal electrons in a very low energy scanning electron microscopy observation of the solids and to extend the examination methods of scanning electron microsc...

BM - Fyzika pevných látek a magnetismus

  • 2000 - 2002
    • •
  • 801 tis. Kč
    • •
  • 708 tis. Kč
    • •
  • GA ČR
  • 1 - 10 out of 6 482