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3 520 (0,097s) •

Project

*New contrast mechanisms in scanning electron microscope (FR-TI3/323)

*Extension of the scope of imaging modes of the scanning electron microscopes produced by the applicant of this project, namely with microscopy of slow electrons of thecrystallinic as well as electronic st...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2011 - 2012
    • •
  • 2 570 tis. Kč
    • •
  • 816 tis. Kč
    • •
  • MPO
Project

Multichannel spectro-microscopy with slow and Auger electrons (IAA1065304)

and elaborate the multichannel collection of image data in the scanning electron microscope, namely in combination of Auger electrons and slow electrons between 10.10.10 and 10 energies of slow electr...

BM - Fyzika pevných látek a magnetismus

  • 2003 - 2005
    • •
  • 2 369 tis. Kč
    • •
  • 1 526 tis. Kč
    • •
  • AV ČR
Project

Scanning transmission electron microscopy with very slow electrons (IAA100650902)

possibilities of the scanning transmission electron microscopy with very low energy, whereScanning transmission electron microscope, usually operating at primary beam paths of elastic (EMFP) and inelastic (IMFP) scattering...

BM - Fyzika pevných látek a magnetismus

  • 2009 - 2011
    • •
  • 2 467 tis. Kč
    • •
  • 2 467 tis. Kč
    • •
  • AV ČR
Project

Electron microscopy (TE01020118)

in the scanning electron microscopes. The most promising directions include microscopy with slow and very slow electrons applied to bulk as well as thin film samples unexploited. With very slow <...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2012 - 2019
    • •
  • 224 313 tis. Kč
    • •
  • 156 888 tis. Kč
    • •
  • TA ČR
Project

Workplace for applications of low voltage electron microscopy on biological specimens (1QS600220501)

atomic number, e.g. biological objects. It uses primary electrons accelerated by the voltage of 5kV. These relatively slow electrons are able to pass through the specimen to create a workplace for applications of low volta...

EA - Morfologické obory a cytologie

  • 2005 - 2009
    • •
  • 3 194 tis. Kč
    • •
  • 3 194 tis. Kč
    • •
  • AV ČR
Project

Kinetic electron emission from metals induced by impact of slow ions (ME10086)

The goal of the project is the explanation of the microscopic mechanism of slow-ion-induced kinetic electron emission from solid surfaces - a problem that has will obtain high quality experimental data of the total electron...

BM - Fyzika pevných látek a magnetismus

  • 2010 - 2012
    • •
  • 3 641 tis. Kč
    • •
  • 1 087 tis. Kč
    • •
  • MŠMT
Project

Ion and electron emission induced by impact of slow atomic particles (IAA1067501)

BM - Fyzika pevných látek a magnetismus

  • 1995 - 1997
    • •
  • 522 tis. Kč
    • •
  • 522 tis. Kč
    • •
  • AV ČR
Project

Slow ion induced kinetic electron emission from metals (MEB060715)

To contribute to the understanding of the fundamental mechanisms of kinetic electron emission from solid surfaces in new joint experiments.......

BM - Fyzika pevných látek a magnetismus

  • 2008 - 2008
    • •
  • 50 tis. Kč
    • •
  • 50 tis. Kč
    • •
  • MŠMT
Project

Automatic analysis of light and electron microscopy neuronal data (GAP202/11/0111)

analysis of 3D light microscopy (mainly confocal microscopy and two-photonmicroscopy) and 3D electron microscopy (mainly a focused ion beamscanning electron microscopy, FIB/SEM), which will segme...

IN - Informatika

  • 2011 - 2014
    • •
  • 4 444 tis. Kč
    • •
  • 4 444 tis. Kč
    • •
  • GA ČR
Project

Mapping at a high spatial resolution of the local density of electron states via reflection of very slow electrons (GA202/04/0281)

When very slow electrons below 20 to 30 eV impact the solid surface. This phenomenon, verified by the low energy electron diffraction experiments, will be employed of structures with locally variable electronic pro...

BM - Fyzika pevných látek a magnetismus

  • 2004 - 2006
    • •
  • 2 658 tis. Kč
    • •
  • 1 658 tis. Kč
    • •
  • GA ČR
  • 1 - 10 out of 3 520