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558 (0,096s) •

Project

Nanometrology using methods of scanning probe microscopy (KAN311610701)

Project is focused on developement of scanning probe microscopy methods focused of microindentation, nanoindentation and scanning probe microscopy, 4) theoretical analysis of the probe-sample interaction effects in scanning...

BM - Fyzika pevných látek a magnetismus

  • 2007 - 2011
    • •
  • 21 074 tis. Kč
    • •
  • 18 713 tis. Kč
    • •
  • AV ČR
Project

*New contrast mechanisms in scanning electron microscope (FR-TI3/323)

*Extension of the scope of imaging modes of the scanning electron microscopes produced by the applicant of this project, namely with microscopy of slow electrons below 50 eV down to units of eV, i.e. in-to the range offering sensitive examin...

JA - Elektronika a optoelektronika, elektrotechnika

  • 2011 - 2012
    • •
  • 2 570 tis. Kč
    • •
  • 816 tis. Kč
    • •
  • MPO
Project

*The research and the development of the non-contact opto-electronic scanning (BOS) for the new methods of diagnosis. (2A-3TP1/040)

*It is the development of the device for scanning of a human body. The device is using the software specialized for the diagnostics....

FS - Lékařská zařízení, přístroje a vybavení

  • 2008 - 2011
    • •
  • 17 267 tis. Kč
    • •
  • 8 125 tis. Kč
    • •
  • MPO
Project

New Generation of Scanning Electron Microscope-Application in Surgery and Related Disciplines (IZ4264)

By means of scanning electron microscope (SEM) of new generation we want to contribute to more objectivite evaluation of tissue surfaces and material surfaces in surgery.......

FJ - Chirurgie včetně transplantologie

  • 1997 - 1999
    • •
  • 2 234 tis. Kč
    • •
  • 2 038 tis. Kč
    • •
  • MZ
Project

Traceability for industrial 3D digitalisation by advanced scanning systems (9B25010)

3D laser scanning systems are vital for the digital transformation of geometric measurements. However, the current metrological tool kit cannot keep up with state of the art 3D laser scanning systems. In addition, assessing the meas...

Optics (including laser optics and quantum optics)

  • 2025 - 2028
    • •
  • 4 028 tis. Kč
    • •
  • 2 015 tis. Kč
    • •
  • MŠMT
Project

A step towards advanced forest inventory through laser scanning and 3D modelling. Can field surveys be minimized? (LUC23023)

and spatially limited, whereas methods using unmanned and airborne laser scanning (ULS field data by virtual 3D forest stands. Terrestrial laser scanning data variability will be compiled, on which laser scanning data w...

Forestry

  • 2023 - 2025
    • •
  • 8 324 tis. Kč
    • •
  • 8 324 tis. Kč
    • •
  • MŠMT
Project

Verification of the principle of zero - charging high resolution scanning electron microscopy and its applications. (GA202/96/0961)

The aim of the project is to verify the newly proposed principle of zero charging scanning electron microscosspy by adapting the existing scanning low energy electron microscope (SLEEM) to the proposed method of measurement and adju...

BM - Fyzika pevných látek a magnetismus

  • 1996 - 1998
    • •
  • 1 238 tis. Kč
    • •
  • 808 tis. Kč
    • •
  • GA ČR
Project

*IFF SYSTEMS - IFF systems including antenna unit with electronic scan (OPELDIS200601)

antenna unit withelectronic scan. The implementation could be realized both antenna unit with electronic scan will stem from current results of IDEBOT project......

JW - Navigace, spojení, detekce a protiopatření

  • 2006 - 2006
    • •
  • 1 500 tis. Kč
    • •
  • 750 tis. Kč
    • •
  • MO
Project

Ab-initio calculations for the interpretation of scanning-probe microscopy (GPP204/11/P578)

Scanning tunneling microscope and atomic force microscope are both capable of imaging solid surfaces with atomic resolution. However, the relation of the tunneling the interaction of the scanning tip with selected types of surfaces....

BM - Fyzika pevných látek a magnetismus

  • 2011 - 2013
    • •
  • 1 527 tis. Kč
    • •
  • 1 527 tis. Kč
    • •
  • GA ČR
Project

Scanning transmission electron microscopy with very slow electrons (IAA100650902)

Scanning transmission electron microscope, usually operating at primary beam energies above tens of keV, is widely used for studiing of thin samples. Mean free paths of elastic (EMFP) and inelastic (IMFP) scattering of electrons increase pos...

BM - Fyzika pevných látek a magnetismus

  • 2009 - 2011
    • •
  • 2 467 tis. Kč
    • •
  • 2 467 tis. Kč
    • •
  • AV ČR
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