Application Possibilities of Several Modern Methods of Microscopy and Microanalysis in Forensic Science Field

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00007064%3AK01__%2F11%3A%230000007" target="_blank" >RIV/00007064:K01__/11:#0000007 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1117/12.887850" target="_blank" >http://dx.doi.org/10.1117/12.887850</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.887850" target="_blank" >10.1117/12.887850</a>

Result language

angličtina

Original language name

Application Possibilities of Several Modern Methods of Microscopy and Microanalysis in Forensic Science Field

Original language description

Microscopy and microanalysis methods have a strong position in forensic field but recent technical innovations have been bringing new possibilities of their application. One of the interesting applications is X-ray Powder Microdiffraction (micro-XRPD) ?allows complex phase analysis on the area of a comparable order to the area under study by the standard methods used at forensic workplaces (namely SEM/EDS). Microscopy and microanalysis are very useful in forensic gemology. With high-tech today a wholeseries of phases get to the market that were not primarily meant for gemology use but are interesting also for use in jewellery. Specialized analytical techniques are needed for their accurate determination. Methods using a focused ion beam - FIB have recently gained importance in the field of electron microscopy. In the forensic sphere they can be employed in examinations of metal materials, technical analyses of documents, post-blast and gunshot residues.

Czech name

—

Czech description

—

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

AQ - Safety and health protection, safety in operating machinery

OECD FORD branch

—

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2011

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

ISSN

0277-786X

e-ISSN

—

Volume of the periodical

2011

Issue of the periodical within the volume

1

Country of publishing house

US - UNITED STATES

Number of pages

6

Pages from-to

803608-803614

UT code for WoS article

—

EID of the result in the Scopus database

—