Potential of Application Focused Ion Beam in Forensic Science Area

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00007064%3AK01__%2F17%3AN0000067" target="_blank" >RIV/00007064:K01__/17:N0000067 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1017/S1431927617001969" target="_blank" >http://dx.doi.org/10.1017/S1431927617001969</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1017/S1431927617001969" target="_blank" >10.1017/S1431927617001969</a>

Result language
angličtina
Original language name
Potential of Application Focused Ion Beam in Forensic Science Area
Original language description
Electron microscopy techniques are widely used in forensic analysis, both for the initial screening and the final expert assessment. There is a wide variety of samples that we analyse at forensic laboratories and experts there may encounter virtually any material, either made by humans or created by nature, which is related to the case under investigation (from fragments of prehistoric vessels, through data and documents to high-tech semi-permeable semiconductors). Striving to extend the analytical tools, we have recently tested the possibility of using the focused ion beam. The respective devices have become conveniently small and the current dual SEM / FIB systems have become standard laboratory equipment.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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