Absolute frequency measurements of wavelength standards 532 nm, 543 nm, 633 nm and 1540 nm

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F07%3A%230000123" target="_blank" >RIV/00177016:_____/07:#0000123 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Absolute frequency measurements of wavelength standards 532 nm, 543 nm, 633 nm and 1540 nm

Original language description

This paper describes the results of absolute frequency measurements of primary wavelength standards 633 nm, 543 nm, 532 nm, (iodine stabilized) and 1540 nm (acetylene stabilized) in CMI. The values obtained with Menlo Systems femtosecond frequency comb in CMI are compared with previous measurements of the same standards in BIPM, BEV and MPQ. Measured sub-Doppler linewidths and relative intensities of several hyperfine spectral components of iodine molecule are also presented.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BH - Optics, masers and lasers

OECD FORD branch

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Project

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Continuities

R - Projekt Ramcoveho programu EK

Publication year

2007

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

European Physical Journal D

ISSN

1434-6060

e-ISSN

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Volume of the periodical

48

Issue of the periodical within the volume

1

Country of publishing house

DE - GERMANY

Number of pages

8

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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