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A simple interferometric method for determining the flatness of large optical flats with 1 nm repeatability

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F08%3A%230000118" target="_blank" >RIV/00177016:_____/08:#0000118 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    A simple interferometric method for determining the flatness of large optical flats with 1 nm repeatability

  • Original language description

    This paper describes a new simple and precise method for flatness measurement using a differential interferometer setup with a moving hollow pentaprism. This method is capable of measuring large optical flats/mirrors (more than 500 mm in diameter) with target uncertainty within the nm order. This device is also relatively easy to transport and is cheap. The first measurements of stability and repeatability are presented.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BH - Optics, masers and lasers

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    R - Projekt Ramcoveho programu EK

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Measurement Science and Technology

  • ISSN

    1361-6501

  • e-ISSN

  • Volume of the periodical

    19

  • Issue of the periodical within the volume

    10

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    5

  • Pages from-to

  • UT code for WoS article

  • EID of the result in the Scopus database