A simple interferometric method for determining the flatness of large optical flats with 1 nm repeatability
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F08%3A%230000118" target="_blank" >RIV/00177016:_____/08:#0000118 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
A simple interferometric method for determining the flatness of large optical flats with 1 nm repeatability
Original language description
This paper describes a new simple and precise method for flatness measurement using a differential interferometer setup with a moving hollow pentaprism. This method is capable of measuring large optical flats/mirrors (more than 500 mm in diameter) with target uncertainty within the nm order. This device is also relatively easy to transport and is cheap. The first measurements of stability and repeatability are presented.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
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Continuities
R - Projekt Ramcoveho programu EK
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Measurement Science and Technology
ISSN
1361-6501
e-ISSN
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Volume of the periodical
19
Issue of the periodical within the volume
10
Country of publishing house
GB - UNITED KINGDOM
Number of pages
5
Pages from-to
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UT code for WoS article
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EID of the result in the Scopus database
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