A Reliable Simple Method to Extract the Intrinsic Material Properties in Millimeter/Sub-millimeter Wave Domain
Result description
A simple method is presented to extract the material characteristics from the scattering parameters in the frequency domain. The method is based on ?transmission? measurement data only and can give the complex permittivity and/or the absorption and refraction index via easy arithmetic operations with closed-form formulas. Therefore, a parametric error analysis will be feasible for metrological aspects to show important uncertainty contributions. The actual measurements have been performed with a compactquasi-optical free-space setup in the frequency band from 50 GHz to 500 GHz and the detailed results are presented to show the performance of the method.
Keywords
The result's identifiers
Result code in IS VaVaI
Result on the web
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6898516
DOI - Digital Object Identifier
Alternative languages
Result language
angličtina
Original language name
A Reliable Simple Method to Extract the Intrinsic Material Properties in Millimeter/Sub-millimeter Wave Domain
Original language description
A simple method is presented to extract the material characteristics from the scattering parameters in the frequency domain. The method is based on ?transmission? measurement data only and can give the complex permittivity and/or the absorption and refraction index via easy arithmetic operations with closed-form formulas. Therefore, a parametric error analysis will be feasible for metrological aspects to show important uncertainty contributions. The actual measurements have been performed with a compactquasi-optical free-space setup in the frequency band from 50 GHz to 500 GHz and the detailed results are presented to show the performance of the method.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
7AX13009: Microwave and terahertz metrology for homeland security
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Conference on Precision Electromagnetic Measurements (CPEM 2014)
ISBN
978-1-4799-2478-3
ISSN
0589-1485
e-ISSN
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Number of pages
2
Pages from-to
576-577
Publisher name
IEEE
Place of publication
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Event location
Rio de Janeiro, Brazil
Event date
Jan 1, 2014
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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Basic information
Result type
D - Article in proceedings
CEP
JA - Electronics and optoelectronics
Year of implementation
2014