Traceable High Impedance Calibration Standards
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F16%3AN0000060" target="_blank" >RIV/00177016:_____/16:N0000060 - isvavai.cz</a>
Alternative codes found
RIV/68407700:21230/16:00243138 RIV/00177016:_____/16:N0000087
Result on the web
<a href="http://ieeexplore.ieee.org/document/7501942/" target="_blank" >http://ieeexplore.ieee.org/document/7501942/</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/ARFTG.2016.7501942" target="_blank" >10.1109/ARFTG.2016.7501942</a>
Alternative languages
Result language
angličtina
Original language name
Traceable High Impedance Calibration Standards
Original language description
The paper deals with S-parameters characterization process of newly developed and fabricated high impedance calibration standards, based on APC-7 microwave connectors, suitable for extreme impedances measurement. It evaluates all critical factors playing significant role in the process including dimension and material characterization and used fabrication technology. A combination of the electromagnetic simulator ANSYS HFSS and precise traceable microwave measurements is used for their final characterization and evaluation of the uncertainty. Finally, some technological solutions which could further improve the characterization uncertainty are proposed.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/7AX13033" target="_blank" >7AX13033: Metrology for new electrical measurement quantities in high-frequency circuits</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
87th ARFTG Microwave Measurement Conference (ARFTG)
ISBN
978-1-5090-1308-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
1-4
Publisher name
IEEE
Place of publication
Piscataway, USA
Event location
San Fransisco, CA
Event date
May 27, 2016
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000389829100003