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Traceable High Impedance Calibration Standards

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F16%3AN0000060" target="_blank" >RIV/00177016:_____/16:N0000060 - isvavai.cz</a>

  • Alternative codes found

    RIV/68407700:21230/16:00243138 RIV/00177016:_____/16:N0000087

  • Result on the web

    <a href="http://ieeexplore.ieee.org/document/7501942/" target="_blank" >http://ieeexplore.ieee.org/document/7501942/</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ARFTG.2016.7501942" target="_blank" >10.1109/ARFTG.2016.7501942</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Traceable High Impedance Calibration Standards

  • Original language description

    The paper deals with S-parameters characterization process of newly developed and fabricated high impedance calibration standards, based on APC-7 microwave connectors, suitable for extreme impedances measurement. It evaluates all critical factors playing significant role in the process including dimension and material characterization and used fabrication technology. A combination of the electromagnetic simulator ANSYS HFSS and precise traceable microwave measurements is used for their final characterization and evaluation of the uncertainty. Finally, some technological solutions which could further improve the characterization uncertainty are proposed.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/7AX13033" target="_blank" >7AX13033: Metrology for new electrical measurement quantities in high-frequency circuits</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    87th ARFTG Microwave Measurement Conference (ARFTG)

  • ISBN

    978-1-5090-1308-1

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    1-4

  • Publisher name

    IEEE

  • Place of publication

    Piscataway, USA

  • Event location

    San Fransisco, CA

  • Event date

    May 27, 2016

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000389829100003