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Uncertainty Evaluation of Balanced S Parameter Measurements

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F16%3AN0000063" target="_blank" >RIV/00177016:_____/16:N0000063 - isvavai.cz</a>

  • Alternative codes found

    RIV/00177016:_____/16:N0000088

  • Result on the web

    <a href="http://ieeexplore.ieee.org/document/7540616/" target="_blank" >http://ieeexplore.ieee.org/document/7540616/</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/CPEM.2016.7540616" target="_blank" >10.1109/CPEM.2016.7540616</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Uncertainty Evaluation of Balanced S Parameter Measurements

  • Original language description

    This paper describes the development of a calibration kit for measuring the scattering parameters (S-parameters) of balanced devices on a printed circuit board (PCB) substrate as well as the estimated uncertainty up to 25 GHz. The calibration kit is composed of a thru, reflect and a set of transmission lines to calibrate a Vector Network Analyzer (VNA) using the Thru Reflect Line (TRL) calibration technique. This work has been carried out through electromagnetic simulations using the Computer Simulation Technology (CST) software. The uncertainties of the S-parameters of each standard are estimated and finally propagated to the S-parameters of the device under test (DUT) using the Monte Carlo method.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/7AX13033" target="_blank" >7AX13033: Metrology for new electrical measurement quantities in high-frequency circuits</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)

  • ISBN

    978-1-4673-9134-4

  • ISSN

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    1-2

  • Publisher name

    IEEE

  • Place of publication

    Piscataway, USA

  • Event location

    Natl Res Council, Ottawa, Canada

  • Event date

    Jul 10, 2016

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000383955100165