Impact of roughness on heat conduction involving nanocontacts
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F21%3AN0000011" target="_blank" >RIV/00177016:_____/21:N0000011 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26620/21:PU143810
Result on the web
<a href="https://aip.scitation.org/doi/full/10.1063/5.0064244" target="_blank" >https://aip.scitation.org/doi/full/10.1063/5.0064244</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/5.0064244" target="_blank" >10.1063/5.0064244</a>
Alternative languages
Result language
angličtina
Original language name
Impact of roughness on heat conduction involving nanocontacts
Original language description
The impact of surface roughness on conductive heat transfer across nanoscale contacts is investigated by means of scanning thermal microscopy. Silicon surfaces with the out-of-plane rms roughness of ∼0, 0.5, 4, 7, and 11 nm are scanned both under air and vacuum conditions. Three types of resistive SThM probes spanning curvature radii over orders of magnitude are used. A correlation between thermal conductance and adhesion force is highlighted. In comparison with a flat surface, the contact thermal conductance can decrease as much as 90% for a microprobe and by about 50% for probes with a curvature radius lower than 50 nm. The effects of multi-contact and ballistic heat conduction are discussed. Limits of contact techniques for thermal conductivity characterization are also discussed.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
21000 - Nano-technology
Result continuities
Project
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Continuities
R - Projekt Ramcoveho programu EK
Others
Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Physics Letters
ISSN
0003-6951
e-ISSN
1077-3118
Volume of the periodical
119
Issue of the periodical within the volume
16
Country of publishing house
US - UNITED STATES
Number of pages
5
Pages from-to
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UT code for WoS article
000721682800017
EID of the result in the Scopus database
2-s2.0-85117703889