Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F24%3AN0000069" target="_blank" >RIV/00177016:_____/24:N0000069 - isvavai.cz</a>
Alternative codes found
RIV/00177016:_____/24:N0000088
Result on the web
<a href="https://zenodo.org/records/14959579" target="_blank" >https://zenodo.org/records/14959579</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/TMTT.2024.3399879" target="_blank" >10.1109/TMTT.2024.3399879</a>
Alternative languages
Result language
angličtina
Original language name
Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods
Original language description
This article reports on an extensive interlaboratory comparison of measurements of material properties between 2 GHz and 1 THz using both vector network analyzer (VNA)-based and optical-based methods. For the former, techniques including open resonators, conventional free-space quasioptical systems, and a relatively new guided free-space approach through use of material characterization kits (MCKs) were utilized. The optical-based methods included both time-domain spectroscopy (TDS) and frequency-domain spectroscopy (FDS). Measurement setups for these five techniques located at five well-established laboratories have been employed in the measurements of seven types of commonly used dielectric materials. The results of the measurements by the participating laboratories using each of these techniques were compared to assess levels of agreement between the utilized techniques and thereby establish confidence in the characterizations of each material. Measurement results of these seven materials are presented, together with detailed discussion. This is the first time that an interlaboratory measurement comparison of material properties has been conducted over nearly three decades of frequency and involving such a range of techniques. This work should prove beneficial to applications where material properties need to be known accurately in the microwave to terahertz region.
Czech name
—
Czech description
—
Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2024
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
IEEE Transactions on Microwave Theory and Techniques
ISSN
0018-9480
e-ISSN
1557-9670
Volume of the periodical
72
Issue of the periodical within the volume
11
Country of publishing house
US - UNITED STATES
Number of pages
12
Pages from-to
6473-6484
UT code for WoS article
001230791900001
EID of the result in the Scopus database
—