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Virtual subpixel approach for single-mask phase-contrast imaging using Timepix3

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11110%2F19%3A10396075" target="_blank" >RIV/00216208:11110/19:10396075 - isvavai.cz</a>

  • Result on the web

    <a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=E5vN12H-fo" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=E5vN12H-fo</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1088/1748-0221/14/01/C01011" target="_blank" >10.1088/1748-0221/14/01/C01011</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Virtual subpixel approach for single-mask phase-contrast imaging using Timepix3

  • Original language description

    X-ray phase contrast imaging provides a method to distinguish materials with similar density and effective atomic number, which otherwise would be difficult using conventional X-ray absorption contrast. In recent years, multiple methods have been developed to acquire X-ray phase contrast images using incoherent laboratory sources. The single mask edge illumination setup has been demonstrated as a possible candidate for large scale applications due to its relaxed restrictions on longitudinal coherence and mask alignment, and for its ability to do bi-directional phase contrast images in a single sample exposure. Unfortunately, the single mask edge illumination setup&apos;s refraction sensitivity, and thereby signal to noise, is limited by detector artifacts. Furthermore, it requires multiple exposures to perform dark-field imaging, a method that enables imaging of micro-structures smaller than the image resolution. We propose using an Advapix detector with Timepix3 pixel-readout chip in a single mask imaging setup to improve signal to noise ratio in phase contrast images. This is achieved using the Timepix3 chip&apos;s ability to simultaneously acquire fast time of arrival and time over threshold measurement of single photon events, which enables sub-pixel identification of individual photons. In this paper, we demonstrate that signal to noise ratio can be improved by at least 67 +/- 5 % using sub-pixel identification of single photons compared to conventional acquisitions methods. Thereby the required sample dose can be reduced considerably. This shows that there is a great potential in using Timepix3 chip to improve x-ray phase contrast imaging. Further, the results indicate the possibility for dark field imaging in a single sample exposure using Timepix3 in a single mask edge illumination setup.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    30224 - Radiology, nuclear medicine and medical imaging

Result continuities

  • Project

  • Continuities

    V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Others

  • Publication year

    2019

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Instrumentation

  • ISSN

    1748-0221

  • e-ISSN

  • Volume of the periodical

    14

  • Issue of the periodical within the volume

    January

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    11

  • Pages from-to

    C01011

  • UT code for WoS article

    000455434700002

  • EID of the result in the Scopus database

    2-s2.0-85062563470