Thickness determination of thin plycrystalline films by low angle incidence diffraction
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F02%3A00003152" target="_blank" >RIV/00216208:11320/02:00003152 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Thickness determination of thin plycrystalline films by low angle incidence diffraction
Original language description
Thickness determination of thin plycrystalline films by low angle incidence diffraction
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Materials Structure in Chemistry, Biology, Physics and Technology
ISSN
1211-5894
e-ISSN
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Volume of the periodical
9
Issue of the periodical within the volume
1a
Country of publishing house
CZ - CZECH REPUBLIC
Number of pages
2
Pages from-to
57-58
UT code for WoS article
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EID of the result in the Scopus database
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