On the microscopic origin of the kinetic step bunching instability on vicinal Si(001)
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F02%3A00003670" target="_blank" >RIV/00216208:11320/02:00003670 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
On the microscopic origin of the kinetic step bunching instability on vicinal Si(001)
Original language description
On the microscopic origin of the kinetic step bunching instability on vicinal Si(001)
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F01%2F0928" target="_blank" >GA202/01/0928: STM study of metal heteroepitaxy on Si surfaces</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Surface Science
ISSN
0039-6028
e-ISSN
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Volume of the periodical
520
Issue of the periodical within the volume
3
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
14
Pages from-to
193-206
UT code for WoS article
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EID of the result in the Scopus database
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