Characterization of the SiO2/Si interface by positron annihilation spectroscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F02%3A00003873" target="_blank" >RIV/00216208:11320/02:00003873 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Characterization of the SiO2/Si interface by positron annihilation spectroscopy
Original language description
Characterization of the SiO2/Si interface by positron annihilation spectroscopy
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Physical Review. B, Condensed Matter
ISSN
0163-1829
e-ISSN
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Volume of the periodical
66
Issue of the periodical within the volume
10
Country of publishing house
US - UNITED STATES
Number of pages
1
Pages from-to
195331-195331
UT code for WoS article
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EID of the result in the Scopus database
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