Structural investigation of semiconductor nanostructures by X-ray techniques
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F03%3A00002402" target="_blank" >RIV/00216208:11320/03:00002402 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Structural investigation of semiconductor nanostructures by X-ray techniques
Original language description
Structural investigation of semiconductor nanostructures by X-ray techniques
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F03%2F0148" target="_blank" >GA202/03/0148: Anomalous x-ray scattering from semiconductor nanostructures</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Nuclear Instruments and Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms
ISSN
0168-583X
e-ISSN
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Volume of the periodical
200
Issue of the periodical within the volume
1
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
13
Pages from-to
11-23
UT code for WoS article
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EID of the result in the Scopus database
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