Coherence effects in nanocrystalline Ti-Al-Si-N thin films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F05%3A00001107" target="_blank" >RIV/00216208:11320/05:00001107 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Coherence effects in nanocrystalline Ti-Al-Si-N thin films
Original language description
Coherence effects in nanocrystalline Ti-Al-Si-N thin films
Czech name
Koherenční efekty v nanokrystalických vrstvách Ti-Al-Si-N
Czech description
Koherenční efekty v nanokrystalických vrstvách Ti-Al-Si-N
Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA106%2F03%2F0819" target="_blank" >GA106/03/0819: Real structure of nanocrystalline thin films studied using X-ray diffraction</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Freiberger Forschungshefte
ISBN
3-86012-256-8
ISSN
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e-ISSN
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Number of pages
3
Pages from-to
36-38
Publisher name
Bergakademie Freiberg
Place of publication
Freibergs
Event location
Freibergs
Event date
Jan 1, 2005
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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