X-ray diffraction from semiconductor nanostructures
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F05%3A00001223" target="_blank" >RIV/00216208:11320/05:00001223 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
X-ray diffraction from semiconductor nanostructures
Original language description
X-ray diffraction from semiconductor nanostructures
Czech name
Rtg difrakce na polovodivých nanostrukturách
Czech description
Rtg difrakce na polovodivých nanostrukturách
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Acta Crystallographica. Section A. Foundations of Crystallography
ISSN
0108-7673
e-ISSN
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Volume of the periodical
A61, 2005
Issue of the periodical within the volume
1
Country of publishing house
DK - DENMARK
Number of pages
1
Pages from-to
"C96"-"C96"
UT code for WoS article
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EID of the result in the Scopus database
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