Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F07%3A00004741" target="_blank" >RIV/00216208:11320/07:00004741 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles
Original language description
Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles
Czech name
Mikroskopie atomárních sil (AFM), transmisní elektronová mikroskopie (TEM) a rastrovací elektronová mikroskopie (SEM) destičkovitých nanočástic jiné fáze
Czech description
Mikroskopie atomárních sil (AFM), transmisní elektronová mikroskopie (TEM) a rastrovací elektronová mikroskopie (SEM) destičkovitých nanočástic jiné fáze
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2007
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Philosophical Magazine
ISSN
1478-6435
e-ISSN
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Volume of the periodical
87
Issue of the periodical within the volume
17
Country of publishing house
GB - UNITED KINGDOM
Number of pages
34
Pages from-to
2427-2460
UT code for WoS article
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EID of the result in the Scopus database
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