Contribution of surface photovoltage method to diagnostics of materials for solar cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F08%3A00101188" target="_blank" >RIV/00216208:11320/08:00101188 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Contribution of surface photovoltage method to diagnostics of materials for solar cells
Original language description
Theory of the surface photovoltage effect was generalized with respect to thickness of the samples. It allowed evaluation of minority carriers in thin Si and CdTe wafers and study the effect of nitride protective layers on properties of silicon solar cells.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů