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Advanced image analysis and its application in thin film physics

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F09%3A00206828" target="_blank" >RIV/00216208:11320/09:00206828 - isvavai.cz</a>

  • Alternative codes found

    RIV/44555601:13440/09:00004864

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Advanced image analysis and its application in thin film physics

  • Original language description

    Very thin metal films deposited on dielectrics consists of small objects distributed on the substrate and the quantitative characterization of objects arrangement can bring information about internal processes in the studied system. In the contribution therefore various morphological algorithms were tested.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/KAN101120701" target="_blank" >KAN101120701: Nanocomposite films and nanoparticles prepared in low pressure plasma for surface modifications</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2009

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Vacuum

  • ISSN

    0042-207X

  • e-ISSN

  • Volume of the periodical

    84

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    4

  • Pages from-to

  • UT code for WoS article

    000270625900068

  • EID of the result in the Scopus database