Advanced image analysis and its application in thin film physics
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F09%3A00206828" target="_blank" >RIV/00216208:11320/09:00206828 - isvavai.cz</a>
Alternative codes found
RIV/44555601:13440/09:00004864
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Advanced image analysis and its application in thin film physics
Original language description
Very thin metal films deposited on dielectrics consists of small objects distributed on the substrate and the quantitative characterization of objects arrangement can bring information about internal processes in the studied system. In the contribution therefore various morphological algorithms were tested.
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/KAN101120701" target="_blank" >KAN101120701: Nanocomposite films and nanoparticles prepared in low pressure plasma for surface modifications</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Vacuum
ISSN
0042-207X
e-ISSN
—
Volume of the periodical
84
Issue of the periodical within the volume
1
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
4
Pages from-to
—
UT code for WoS article
000270625900068
EID of the result in the Scopus database
—