Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F09%3A00207216" target="_blank" >RIV/00216208:11320/09:00207216 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests

Original language description

Pixel sensors with micron resolution are being developed by several groups, and this development comes hand in hand with the development of new resolution enhancement methods. This paper summarizes the results of our study of hit reconstruction methods used in analysis of DEPFET.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BF - Elementary particle theory and high energy physics

OECD FORD branch

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Project

<a href="/en/project/GA202%2F07%2F0740" target="_blank" >GA202/07/0740: Development of semiconductor detectors for new high-energy physics experiments</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Nuclear Instruments and Methods in Physics Research. Section A. Accelerators. Spectrometers. Detectors and Associated Equipment

ISSN

0168-9002

e-ISSN

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Volume of the periodical

604

Issue of the periodical within the volume

1-2

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

5

Pages from-to

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UT code for WoS article

000267405700101

EID of the result in the Scopus database

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