Contribution of the thermoelectric effect to the morphological stability/instability of dielectric films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F10%3A10080100" target="_blank" >RIV/00216208:11320/10:10080100 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Contribution of the thermoelectric effect to the morphological stability/instability of dielectric films
Original language description
The article deals with the problem of morphological stability/instability of a dielectric film in a temperature gradient. It has been found that the electric field, generated as a result of Seebeck's dielectric effect (M. Marvan, Czech J. Phys. 19 (1969)1240), may contribute substantially to the instability of thin dielectric layers. We have found the conditions under which Seebeck's dielectric effect contributes to the creation of nano- or micro-structures.
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—
Result continuities
Project
—
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Europhysics Letters
ISSN
0295-5075
e-ISSN
—
Volume of the periodical
89
Issue of the periodical within the volume
1
Country of publishing house
FR - FRANCE
Number of pages
5
Pages from-to
—
UT code for WoS article
000273855100033
EID of the result in the Scopus database
—