Polarization Study of Defect Structure of CdTe
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F11%3A10105670" target="_blank" >RIV/00216208:11320/11:10105670 - isvavai.cz</a>
Result on the web
<a href="http://ieeexplore.ieee.org/xpl/tocresult.jsp?asf_arn=null&asf_iid=0&asf_pun=23&asf_in=6&asf_rpp=null&asf_iv=58&asf_sp=3172&asf_pn=1" target="_blank" >http://ieeexplore.ieee.org/xpl/tocresult.jsp?asf_arn=null&asf_iid=0&asf_pun=23&asf_in=6&asf_rpp=null&asf_iv=58&asf_sp=3172&asf_pn=1</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/TNS.2011.2165730" target="_blank" >10.1109/TNS.2011.2165730</a>
Alternative languages
Result language
angličtina
Original language name
Polarization Study of Defect Structure of CdTe
Original language description
Polarization of CdTe radiation detectors in the dark was studied theoretically by taking into account a wide set of detector characteristics relevant to the polarization. Drift-diffusion and Poisson equations were solved numerically in one dimension in time-resolved regime, where the characteristic time is determined by the charging of detector bulk. Shockley-Read-Hall model describes the trapping/detrapping of free carriers. Both diode-like (In,Al)/CdTe/Pt and symmetrical (In,Al,Pt)/CdTe/(In,Al,Pt) detectors were considered. We showed how the space charge is formed in time after detector biasing and a dead layer appears in the detector when the accumulated charge screens the bias. Numerical results were compared with the Conventional model of charge accumulation. The influence of temperature on polarization was analyzed and the polarization is correlated with current transient. The approach can be conveniently used to find principal properties of trap levels and contacts in semiconduc
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GAP102%2F10%2F0148" target="_blank" >GAP102/10/0148: Influence of Te inclusions on performance of CdTe and CdZnTe radiation detectors</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
IEEE Transactions on Nuclear Science
ISSN
0018-9499
e-ISSN
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Volume of the periodical
58
Issue of the periodical within the volume
6
Country of publishing house
US - UNITED STATES
Number of pages
10
Pages from-to
3172-3181
UT code for WoS article
000301285700004
EID of the result in the Scopus database
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