Adjusting Morphology and Surface Reduction of CeO(2)(111) Thin Films on Cu(111)

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F11%3A10108232" target="_blank" >RIV/00216208:11320/11:10108232 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1021/jp1121646" target="_blank" >http://dx.doi.org/10.1021/jp1121646</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1021/jp1121646" target="_blank" >10.1021/jp1121646</a>

Result language
angličtina
Original language name
Adjusting Morphology and Surface Reduction of CeO(2)(111) Thin Films on Cu(111)
Original language description
Adjustable morphology and degree of reduction represent desirable properties of model oxide substrates for heterogeneous catalysis. We investigate these properties in CeO(2) (ceria) thin films on Cu(111) using scanning tunneling microscopy and photoelectron spectroscopy. We identify growth mechanisms of ceria on Cu(111) formation of incomplete oxide inter acial layer and formation of three-dimensional ceria pyramids by stacking of monolayer-high islands. Using these mechanisms, we control the coverage,the number of open monolayers, and the-setp density of ceria thin films on Cu(111). Annealing in vacuum allows us to control besides the morphology also the degree of ceria surface reduction. We find a correlation between surface reduction and morphological stability in annealed ceria layers. Oriented and stoichiometric thin films of ceria on Cu(111) can be prepared at temperatures as low as 150 and 250 degrees C. Both the morphology and the surface reduction of these films readily chang
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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