Solarius Particles 1-0
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F12%3A10124066" target="_blank" >RIV/00216208:11320/12:10124066 - isvavai.cz</a>
Result on the web
<a href="http://solarius-software.sweb.cz/" target="_blank" >http://solarius-software.sweb.cz/</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Solarius Particles 1-0
Original language description
This program is for measurement of sizes of particles and nanoparticles. It can be useful especially in cases where one needs to determine size distribution of particles from an image where the particles touch or even overlap each other. It can be usefulin any other circumstances (like not completely homogeneous substrate or slightly blurred edges of particles) when images cannot be characterized using common software (e.g. ImageJ) for finding binary threshold between particles and substrate.
Czech name
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Czech description
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Classification
Type
R - Software
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Internal product ID
solsoft001
Technical parameters
Analýza distribuce nanočástic. Kontaktní osoba Pavel Solař, e-mail: pawell.solar@seznam.cz
Economical parameters
Analýza SEM, TEM a AFM mikrografů pro charakteritaci nanočásticových vrstev a jejich kompozitů.
Owner IČO
00216208
Owner name
Univerzita Karlova v Praze