Slow-Polishing Iodine-Based Etchant for CdTe and CdZnTe Single Crystals
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F12%3A10127045" target="_blank" >RIV/00216208:11320/12:10127045 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1007/s11664-012-2001-1" target="_blank" >http://dx.doi.org/10.1007/s11664-012-2001-1</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/s11664-012-2001-1" target="_blank" >10.1007/s11664-012-2001-1</a>
Alternative languages
Result language
angličtina
Original language name
Slow-Polishing Iodine-Based Etchant for CdTe and CdZnTe Single Crystals
Original language description
We report on new etching solutions for treatment of CdTe and CdZnTe surfaces based on the iodine-emerging etchant composition KIO3-KI-citric acid (C6H8O7). CdTe samples with (111), (110), and (100) orientations, and also Cd1-x Zn (x) Te (x = 0.04, 0.1) samples with (111), (110), (100), and (211) orientations were investigated. The dissolution rate was determined as a function of solution composition, etchant storage time, disc rotation speed, and temperature. It was established that this chemical dissolution is diffusion controlled. Study of the chemical composition and structure of (211)B Cd1-x Zn (x) Te surfaces etched under different conditions was carried out. x-Ray photoelectron spectroscopy measurements showed that a stoichiometric surface was achieved after briefly heating the etched surface in a vacuum. Reflection high-energy electron diffraction measurements revealed a high-quality single-crystalline surface layer in samples etched with KIO3-KI-citric acid solutions as compare
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GAP102%2F10%2F0148" target="_blank" >GAP102/10/0148: Influence of Te inclusions on performance of CdTe and CdZnTe radiation detectors</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Electronic Materials
ISSN
0361-5235
e-ISSN
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Volume of the periodical
41
Issue of the periodical within the volume
10
Country of publishing house
US - UNITED STATES
Number of pages
8
Pages from-to
2838-2845
UT code for WoS article
000308655500028
EID of the result in the Scopus database
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