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X-ray small-angle scattering from sputtered CeO2/C bilayers

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F13%3A10140088" target="_blank" >RIV/00216208:11320/13:10140088 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1063/1.4773446" target="_blank" >http://dx.doi.org/10.1063/1.4773446</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1063/1.4773446" target="_blank" >10.1063/1.4773446</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    X-ray small-angle scattering from sputtered CeO2/C bilayers

  • Original language description

    Surface and interface morphology of cerium oxide/carbon bilayers used as thin-film catalysts is studied by grazing-incidence small-angle x-ray scattering, scanning electron microscopy, and atomic-force microscopy, and the dependence of the structural parameters on the thicknesses of the constituting layers is investigated. The applicability of x-ray scattering and its advantages over standard analytical methods are discussed. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4773446]

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GAP204%2F11%2F0785" target="_blank" >GAP204/11/0785: Self-organized growth and structure transitions of nanocrystals</a><br>

  • Continuities

    S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Applied Physics

  • ISSN

    0021-8979

  • e-ISSN

  • Volume of the periodical

    113

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    7

  • Pages from-to

  • UT code for WoS article

    000313644500067

  • EID of the result in the Scopus database