X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F15%3A10295318" target="_blank" >RIV/00216208:11320/15:10295318 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1107/S160057751402284X" target="_blank" >http://dx.doi.org/10.1107/S160057751402284X</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1107/S160057751402284X" target="_blank" >10.1107/S160057751402284X</a>

Result language
angličtina
Original language name
X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment
Original language description
The spatial strain distribution in and around a single axial InAs1-xPx hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire's inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire's and hetero-segment's dimensions affect the strain in its core region and in the region close to the nanowire's side facets. Moreover, ensemble-averaging high-resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc-blende crystal polytypes in the nanowires.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Project
<a href="/en/project/GA14-08124S" target="_blank" >GA14-08124S: High-resolution x-ray diffraction from random layered systems</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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