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Structural investigations of the alpha(12) Si-Ge superstructure

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F15%3A10295321" target="_blank" >RIV/00216208:11320/15:10295321 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1107/S1600576715000849" target="_blank" >http://dx.doi.org/10.1107/S1600576715000849</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1107/S1600576715000849" target="_blank" >10.1107/S1600576715000849</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Structural investigations of the alpha(12) Si-Ge superstructure

  • Original language description

    This article reports the X-ray diffraction-based structural characterization of the (12) multilayer structure SiGe2Si2Ge2SiGe12 [d'Avezac, Luo, Chanier & Zunger (2012). Phys. Rev. Lett.108, 027401], which is predicted to form a direct bandgap material. In particular, structural parameters of the superlattice such as thickness and composition as well as interface properties, are obtained. Moreover, it is found that Ge subsequently segregates into layers. These findings are used as input parameters for band structure calculations. It is shown that the direct bandgap properties depend very sensitively on deviations from the nominal structure, and only almost perfect structures can actually yield a direct bandgap. Photoluminescence emission possibly stemming from the superlattice structure is observed.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA14-08124S" target="_blank" >GA14-08124S: High-resolution x-ray diffraction from random layered systems</a><br>

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2015

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Applied Crystallography

  • ISSN

    0021-8898

  • e-ISSN

  • Volume of the periodical

    48

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    DK - DENMARK

  • Number of pages

    7

  • Pages from-to

    262-268

  • UT code for WoS article

    000349210700033

  • EID of the result in the Scopus database

    2-s2.0-84922324939