Structural investigations of the alpha(12) Si-Ge superstructure
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F15%3A10295321" target="_blank" >RIV/00216208:11320/15:10295321 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1107/S1600576715000849" target="_blank" >http://dx.doi.org/10.1107/S1600576715000849</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1107/S1600576715000849" target="_blank" >10.1107/S1600576715000849</a>
Alternative languages
Result language
angličtina
Original language name
Structural investigations of the alpha(12) Si-Ge superstructure
Original language description
This article reports the X-ray diffraction-based structural characterization of the (12) multilayer structure SiGe2Si2Ge2SiGe12 [d'Avezac, Luo, Chanier & Zunger (2012). Phys. Rev. Lett.108, 027401], which is predicted to form a direct bandgap material. In particular, structural parameters of the superlattice such as thickness and composition as well as interface properties, are obtained. Moreover, it is found that Ge subsequently segregates into layers. These findings are used as input parameters for band structure calculations. It is shown that the direct bandgap properties depend very sensitively on deviations from the nominal structure, and only almost perfect structures can actually yield a direct bandgap. Photoluminescence emission possibly stemming from the superlattice structure is observed.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA14-08124S" target="_blank" >GA14-08124S: High-resolution x-ray diffraction from random layered systems</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Applied Crystallography
ISSN
0021-8898
e-ISSN
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Volume of the periodical
48
Issue of the periodical within the volume
1
Country of publishing house
DK - DENMARK
Number of pages
7
Pages from-to
262-268
UT code for WoS article
000349210700033
EID of the result in the Scopus database
2-s2.0-84922324939