Interface effects in nanometer-thick yttrium iron garnet films studied by magneto- optical spectroscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F16%3A10333794" target="_blank" >RIV/00216208:11320/16:10333794 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.1063/1.4942379" target="_blank" >http://dx.doi.org/10.1063/1.4942379</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1063/1.4942379" target="_blank" >10.1063/1.4942379</a>

Result language

angličtina

Original language name

Interface effects in nanometer-thick yttrium iron garnet films studied by magneto- optical spectroscopy

Original language description

The properties of nanometer-thick yttrium iron garnet (YIG) films are strongly influenced by interfa-ces. This work employs spectral ellipsometry (SE) and magneto-optic polar Kerr rotation (PKR) to characterize YIG films with thickness,t, from 6 nm to 30 nm grown on Gd3Ga5O12(GGG) substrates oriented parallel to (111) plane. The films display a surface roughness of 0.35 nm or lower. The analysis of the SE data at the photon energies of 1 eV<E<6.5 eV provided thet and permittivity values. The PKR at 1.3 eV<E<4.5 eV is reasonably explained with the optical model for the YIG film/GGG substrate system. Even better agreement is achieved by assuming a 1.07-nm-thick layer sandwiched between YIG and GGG that has Fe3+ sublattice magnetization opposite to that in the YIG volume. This suggests the existence of antiferromagnetic coupling between the Gd3+ and tet-rahedral Fe3+

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/GA15-21547S" target="_blank" >GA15-21547S: Characterization of magnetic nanostructures with optical techniques</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2016

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Applied Physics Letters

ISSN

0003-6951

e-ISSN

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Volume of the periodical

2016

Issue of the periodical within the volume

108

Country of publishing house

US - UNITED STATES

Number of pages

5

Pages from-to

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UT code for WoS article

000373057000027

EID of the result in the Scopus database

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