Note: On the choice of the appropriate excitation-pulse-length for assessment of slow luminescence decays
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F16%3A10334927" target="_blank" >RIV/00216208:11320/16:10334927 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1063/1.4971368" target="_blank" >http://dx.doi.org/10.1063/1.4971368</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1063/1.4971368" target="_blank" >10.1063/1.4971368</a>
Alternative languages
Result language
angličtina
Original language name
Note: On the choice of the appropriate excitation-pulse-length for assessment of slow luminescence decays
Original language description
The decay-time distribution deduced from luminescence kinetics experiments is, in general, dependent on the excitation pulse length as a direct consequence of different onset dynamics. We demonstrate this effect for the case of square excitation pulses applied to study the luminescence kinetics in Si nanocrystals. The short- and long-pulse limits are defined as 0.1 times the shortest lifetime in the distribution and 3 times the longest time, respectively. Outside these limits the decay-time distribution is independent on the pulse duration. In addition, we describe experimental conditions required to obtain a correct depiction of slow luminescence decay in the μs to ms time range.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GC16-09745J" target="_blank" >GC16-09745J: Understanding the Luminescence Efficiency of Silicon Quantum Dots</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Review of Scientific Instruments
ISSN
0034-6748
e-ISSN
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Volume of the periodical
87
Issue of the periodical within the volume
7 December 2016
Country of publishing house
US - UNITED STATES
Number of pages
3
Pages from-to
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UT code for WoS article
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EID of the result in the Scopus database
2-s2.0-85005978056