Fourier factorization in the constitutive relations for modeling diffraction gratings with continuous permittivity profiles

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10370331" target="_blank" >RIV/00216208:11320/17:10370331 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1364/OE.25.024370" target="_blank" >http://dx.doi.org/10.1364/OE.25.024370</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/OE.25.024370" target="_blank" >10.1364/OE.25.024370</a>

Result language
angličtina
Original language name
Fourier factorization in the constitutive relations for modeling diffraction gratings with continuous permittivity profiles
Original language description
The validity of the Fourier factorization (FF) rules used in the constitutive relations in the Fourier modal method is analyzed for one-dimensional diffraction gratings made as a thin film with uniform thickness and several examples of continuous lateral profiles of permittivity. The comparison of the method using the correct FF rules with other FF choices demonstrates the validity of the FF rules for any inhomogeneous, not only discontinuous profile. (C) 2017 Optical Society of America
Czech name
—
Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
10102 - Applied mathematics

Project
<a href="/en/project/GA16-13876S" target="_blank" >GA16-13876S: Fabrication and characterization of micro- and nanostructures in high refractive index glasses</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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