XPS study of the SnO2 films modified with Rh

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F18%3A10386160" target="_blank" >RIV/00216208:11320/18:10386160 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1002/sia.6476" target="_blank" >https://doi.org/10.1002/sia.6476</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/sia.6476" target="_blank" >10.1002/sia.6476</a>

Result language
angličtina
Original language name
XPS study of the SnO2 films modified with Rh
Original language description
In this paper, we have analyzed the effect of the rhodium surface modification on the surface state of SnO2 films. SnO2 films, subjected for the surface modification, were deposited by spray pyrolysis, while Rh was deposited by using a microelectron beam evaporation. The thickness of the Rh coating varied in the range 0 to 0.1 monolayer. An explanation of the observed effects was proposed. Basing on the results of X-ray photoelectron spectroscopy, it was assumed that at a small thickness of the rhodium covering, Rh was in a the well-dispersed state, close to atomically dispersed state. The growth in the size of the nanoparticles began mainly when the thickness of the Rh covering exceeeded 0.01 monolayer. The size of clusters did not exceed 0.5 to 1.0nm.
Czech name
—
Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10305 - Fluids and plasma physics (including surface physics)

Project
<a href="/en/project/LM2015057" target="_blank" >LM2015057: Surface Physics Laboratory – Materials Science Beamline</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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