Diagnostics and qualitative analysis of highly charged ions emitted from copper foil exposed to ultrashort x-ray laser pulses
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F25%3A10501610" target="_blank" >RIV/00216208:11320/25:10501610 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1117/12.3056238" target="_blank" >https://doi.org/10.1117/12.3056238</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.3056238" target="_blank" >10.1117/12.3056238</a>
Alternative languages
Result language
angličtina
Original language name
Diagnostics and qualitative analysis of highly charged ions emitted from copper foil exposed to ultrashort x-ray laser pulses
Original language description
Ultrashort, 25-fs pulses of x-ray free-electron laser (XFEL) radiation (9.3-keV photons; a pulse energy of 2 mJ) have been micro-focused on the surface of 3-micrometer Cu foil. The interaction experiment has been performed at the European XFEL facility in Schenefeld (Germany). In this contribution emphasis will be placed on the diagnosis and qualitative analysis of emitted highly charged Cu ions using an ion expansion model based on a shifted Maxwell-Boltzmann distribution of ion velocities. This phenomenological approach makes possible to evaluate the charge states of ions belonging to copper stable isotopes Cu-63 and Cu-65 and to determine the voltages by which ion jets are accelerated. This work, describing the properties of ions produced from a mid-Z elemental target exposed to ultrashort x-ray FEL pulses at an irradiance of 10 exa-watts per square centimetre, sheds light on processes occurring in volumetrically heated dense matter on several timescales.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
10305 - Fluids and plasma physics (including surface physics)
Result continuities
Project
—
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
OPTICS DAMAGE AND MATERIALS PROCESSING BY EUV/X-RAY RADIATION, XDAM9
ISBN
978-1-5106-8862-9
ISSN
0277-786X
e-ISSN
1996-756X
Number of pages
8
Pages from-to
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Publisher name
SPIE-INT SOC OPTICAL ENGINEERING
Place of publication
BELLINGHAM
Event location
Praha
Event date
Apr 7, 2025
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
001559199900001