Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F01%3A00005200" target="_blank" >RIV/00216224:14310/01:00005200 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires

Original language description

The structure of self-organized quantum wires buried at the interfaces of a SiGe/Si multilayer is investigated by grazing incidence small-angle x-ray scattering. A nearly periodic distribution of wires, well described by a short-range ordering model, gives rise to intensity satellite maxima in reciprocal space. The shape of the wire cross section is determined from the heights of these intensity maxima, and the analysis reveals that the conventional step-bunching model is not sufficient to explain the wire shape.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/GA202%2F00%2F0354" target="_blank" >GA202/00/0354: Self-organisation processes on the interfaces during epitaxial growth of semiconductor superlattices</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2001

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Phys. Rev. B

ISSN

0163-1829

e-ISSN

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Volume of the periodical

63

Issue of the periodical within the volume

20

Country of publishing house

CZ - CZECH REPUBLIC

Number of pages

10

Pages from-to

5318

UT code for WoS article

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EID of the result in the Scopus database

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