Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F02%3A00007676" target="_blank" >RIV/00216224:14310/02:00007676 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers
Original language description
Non-specular X-ray reflection from self-organized ripple structures in Si/Ge multilayers
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F00%2F0354" target="_blank" >GA202/00/0354: Self-organisation processes on the interfaces during epitaxial growth of semiconductor superlattices</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Physica E
ISSN
1386-9477
e-ISSN
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Volume of the periodical
13
Issue of the periodical within the volume
4
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
7
Pages from-to
1003-1009
UT code for WoS article
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EID of the result in the Scopus database
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