Structural investigation of semiconductor nanostructures by x-ray techniques
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F02%3A00007678" target="_blank" >RIV/00216224:14310/02:00007678 - isvavai.cz</a>
Alternative codes found
RIV/00216224:14310/03:00009466
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Structural investigation of semiconductor nanostructures by x-ray techniques
Original language description
Structural investigation of semiconductor nanostructures by x-ray techniques
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F00%2F0354" target="_blank" >GA202/00/0354: Self-organisation processes on the interfaces during epitaxial growth of semiconductor superlattices</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Nuclear Instruments & Methods in Physics Research A
ISSN
0168-9002
e-ISSN
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Volume of the periodical
200
Issue of the periodical within the volume
1
Country of publishing house
US - UNITED STATES
Number of pages
13
Pages from-to
11-23
UT code for WoS article
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EID of the result in the Scopus database
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