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Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F03%3A00009587" target="_blank" >RIV/00216224:14310/03:00009587 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique

  • Original language description

    In the present work the lattice plane curvature of a nearly dislocation free S:doped InP and a semi-insulating GaAs wafer crystals has been investigated using the method of X-ray rocking curve imaging based on the FReLoN CCD area detector with a pixel resolution from 10 to 40 um at the ID19 ESRF beamline. The geometry of the experiment is based on a vertical Si (111) monochromator and a horizontal sample scattering planes in the Bragg geometry (sigma-pi geometry). To determine the local lattice inclination, the effect of such dispersive setup on the measured local diffraction peak position has been accurately determined and the equations to determine the lattice plane curvature of the crystals under the condition of isotropic distribution of dislocation Burgers vectors are obtained. The analysis of the data showed that the shift of the Bragg condition is almost completely due to the lattice tilt rather than to the lattice parameter variation. Lattice displacements from the ideal lattic

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2003

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Proceedings of SPIE: Crystals, Multilayers, and Other Synchrotron Optics

  • ISSN

    0-8194-5068-5

  • e-ISSN

  • Volume of the periodical

    5195

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    10

  • Pages from-to

    84-93

  • UT code for WoS article

  • EID of the result in the Scopus database