Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F03%3A00009587" target="_blank" >RIV/00216224:14310/03:00009587 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique
Original language description
In the present work the lattice plane curvature of a nearly dislocation free S:doped InP and a semi-insulating GaAs wafer crystals has been investigated using the method of X-ray rocking curve imaging based on the FReLoN CCD area detector with a pixel resolution from 10 to 40 um at the ID19 ESRF beamline. The geometry of the experiment is based on a vertical Si (111) monochromator and a horizontal sample scattering planes in the Bragg geometry (sigma-pi geometry). To determine the local lattice inclination, the effect of such dispersive setup on the measured local diffraction peak position has been accurately determined and the equations to determine the lattice plane curvature of the crystals under the condition of isotropic distribution of dislocation Burgers vectors are obtained. The analysis of the data showed that the shift of the Bragg condition is almost completely due to the lattice tilt rather than to the lattice parameter variation. Lattice displacements from the ideal lattic
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Proceedings of SPIE: Crystals, Multilayers, and Other Synchrotron Optics
ISSN
0-8194-5068-5
e-ISSN
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Volume of the periodical
5195
Issue of the periodical within the volume
1
Country of publishing house
US - UNITED STATES
Number of pages
10
Pages from-to
84-93
UT code for WoS article
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EID of the result in the Scopus database
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