Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F09%3A00028548" target="_blank" >RIV/00216224:14310/09:00028548 - isvavai.cz</a>

Alternative codes found

RIV/00177016:_____/09:#0000358

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Tip-sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements

Original language description

Nanoscale dimensional measurements are very often focused on small objects formed by only a few atomic layers in one or more dimensions. The classical convolution approach to tip-sample artefacts cannot be valid for these specimens due to the quantum-mechanical nature of small objects. As interatomic forces act on the sample and the tip of the microscope, the atoms of both relax in order to reach equilibrium positions. This leads to changes in those quantities that are finally interpreted as the atomicforce microscope (AFM) tip position and influences the resultant dimensional measurements. In this paper, sources of uncertainty connected with tip-surface relaxation at the atomic level are discussed. Results of density functional theory modeling (usingthe tight-binding approximation software Fireball) of AFM scans on typical systems used in nanometrology, e.g., fullerenes and carbon nanotubes, on highly oriented pyrolytic graphite substrates are presented.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/KAN311610701" target="_blank" >KAN311610701: Nanometrology using methods of scanning probe microscopy</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Measurement Science and Technology

ISSN

0957-0233

e-ISSN

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Volume of the periodical

20

Issue of the periodical within the volume

084014

Country of publishing house

CZ - CZECH REPUBLIC

Number of pages

6

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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