Broadening of dielectric response and sum rule conservation

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F14%3A00079589" target="_blank" >RIV/00216224:14310/14:00079589 - isvavai.cz</a>

Result on the web

<a href="http://ac.els-cdn.com/S0040609013020580/1-s2.0-S0040609013020580-main.pdf?_tid=9dc4242c-cd4e-11e4-81d3-00000aab0f27&acdnat=1426670006_2cfda1649715e3b4127d412cee6b028a" target="_blank" >http://ac.els-cdn.com/S0040609013020580/1-s2.0-S0040609013020580-main.pdf?_tid=9dc4242c-cd4e-11e4-81d3-00000aab0f27&acdnat=1426670006_2cfda1649715e3b4127d412cee6b028a</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.tsf.2013.11.148" target="_blank" >10.1016/j.tsf.2013.11.148</a>

Result language

angličtina

Original language name

Broadening of dielectric response and sum rule conservation

Original language description

Different types of broadening of the dielectric response are studied with respect to the preservation of the Thomas-Reiche-Kuhn sum rule. It is found that only the broadening of the dielectric function and transition strength function conserve this sum rule, whereas the broadening of the transition probability function (joint density of states) increases or decreases the sum. The effect of different kinds of broadening is demonstrated for interband and intraband direct electronic transitions using simplified rectangular models. It is shown that the broadening of the dielectric function is more suitable for interband transitions while broadening of the transition strength function is more suitable for intraband transitions. (C) 2013 Elsevier B.V. All rights reserved.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2014

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Thin Solid Films

ISSN

0040-6090

e-ISSN

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Volume of the periodical

571

Issue of the periodical within the volume

November

Country of publishing house

CH - SWITZERLAND

Number of pages

6

Pages from-to

496-501

UT code for WoS article

000346055200028

EID of the result in the Scopus database

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