Suitability of Wiener Process Based Model for Prediction of Temperature Dependent Super Capacitor Availability
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F15%3A00116093" target="_blank" >RIV/00216224:14310/15:00116093 - isvavai.cz</a>
Alternative codes found
RIV/60162694:G43__/15:00531760
Result on the web
<a href="https://ieeexplore.ieee.org/document/7385754?section=abstract" target="_blank" >https://ieeexplore.ieee.org/document/7385754?section=abstract</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Suitability of Wiener Process Based Model for Prediction of Temperature Dependent Super Capacitor Availability
Original language description
In this paper we focus on the estimation of the essential availability and reliability characteristics of super capacitors. The estimation is based on experimental data calculation using a Wiener process. The experimental data were acquired when performing the accelerated tests of super capacitors in the thermal climatic chamber Votsch VC3 7034. Three thermal levels were used when performing the accelerated tests. Our approach presented in the paper is predominantly not focused on a failure occurrence but on performance durability and availability assessment such as functional stability. We will assess correct functioning and first hitting time if the super capacitor loses its power capacity.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2015 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL ENGINEERING AND ENGINEERING MANAGEMENT (IEEM)
ISBN
9781467380669
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
782-786
Publisher name
IEEE
Place of publication
NEW YORK
Event location
Singapore, SINGAPORE
Event date
Dec 6, 2015
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000380434300159