Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F98%3A00003212" target="_blank" >RIV/00216224:14310/98:00003212 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Statistical properties of the near-field speckle patterns of thin films with slightly rough boundaries
Original language description
In this theoretical paper the basic statistical quantities of the light intensity above thin-film systems with randomly rough boundaries are studied in the near-field. This means that formulae for the mean intensity, standard deviation of the intensity,correlation function of the intensity and the speckle contrast are derived for the systems mentioned in the near-field. It is assumed that the boundaries of the systems are slightly rough, i.e. that the rms values of heights of the irregularities of theboundaries are much smaller than the wavelength of incident light. The Rayleigh-Rice approach is employed for deriving the formulae expressing the quantities specified. In conclusion a brief numerical analysis of the theoretical results is presented.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BH - Optics, masers and lasers
OECD FORD branch
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Project
<a href="/en/project/GA202%2F98%2F0988" target="_blank" >GA202/98/0988: Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
1998
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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