High-Resolution X-Ray Scattering From Thin Films and Multilayers
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F99%3A00002996" target="_blank" >RIV/00216224:14310/99:00002996 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
High-Resolution X-Ray Scattering From Thin Films and Multilayers
Original language description
High-Resolution X-Ray Scattering From Thin Films and Multilayers
Czech name
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Czech description
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Classification
Type
B - Specialist book
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
1999
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
ISBN
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Number of pages
256
Publisher name
Springer Tracts in Modern Physics
Place of publication
Berlin, Heidelberg, New York
UT code for WoS book
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