ELEMENTAL MAPPING USING THE SIMULTANEOUS DP-LIBS AND LA-ICP-OES SETUP
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14740%2F13%3A00070562" target="_blank" >RIV/00216224:14740/13:00070562 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
ELEMENTAL MAPPING USING THE SIMULTANEOUS DP-LIBS AND LA-ICP-OES SETUP
Original language description
The main advantage of DP-LIBS for surface analysis is not the quantitative accuracy of the obtained chemical information but the fact that each sampling position in DP-LIBS is analyzed individually. On the other hand, the approaches used for surface investigation based on laser ablation in which the ablated material is transported to a second excitation/ionization source (LA-ICP-OES or LA-ICPMS) are generally characterized by lower matrix effects and higher accuracy of quantitative results. The aim of this study was focused on the development of analytical methods for the spatially resolved elemental mapping using both approaches simultaneously.
Czech name
—
Czech description
—
Classification
Type
O - Miscellaneous
CEP classification
CB - Analytical chemistry, separation
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/ED1.1.00%2F02.0068" target="_blank" >ED1.1.00/02.0068: Central european institute of technology</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů