Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14740%2F14%3A00079915" target="_blank" >RIV/00216224:14740/14:00079915 - isvavai.cz</a>
Result on the web
<a href="http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1904541" target="_blank" >http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1904541</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2061353" target="_blank" >10.1117/12.2061353</a>
Alternative languages
Result language
angličtina
Original language name
Simulations and surface quality testing of high asymmetry angle X-ray crystal monochromators for advanced X-ay imaging applications
Original language description
Advanced X-ray imaging techniques of weakly absorbing structures require an increase of the sensitivity to small refractive angles considering that they are based more on coherent X-ray phase contrast than on X-ray absorption one. Simulations of diffraction properties of germanium (Ge) X-ray crystal monochromators and of analyzer based imaging (ABI) method were performed for various asymmetry factors and several lattice plane orientations using an X-ray energy range from 8 keV to 20 keV. Using an appropriate phase/amplitude retrieval method one can recover the phase information from the ABI image, which is directly proportional to the projected electron density. We are using germanium based optics for X-ray imaging or image magnification. The use of Gecrystals offers several advantages over silicon crystals. The integrated reflectivity of Ge crystals is two to three times larger than that of Si crystals.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/ED1.1.00%2F02.0068" target="_blank" >ED1.1.00/02.0068: Central european institute of technology</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Advances in X-Ray/EUV Optics and Components IX
ISBN
9781628412345
ISSN
0277-786X
e-ISSN
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Number of pages
14
Pages from-to
"nestránkováno"
Publisher name
SPIE-INT SOC OPTICAL ENGINEERING
Place of publication
USA
Event location
San Diego
Event date
Oct 8, 2014
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000343877600030