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Nanostructuring of organic and chalcogenide resists by direct DUV laser beam writing

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F04%3A00001370" target="_blank" >RIV/00216275:25310/04:00001370 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Nanostructuring of organic and chalcogenide resists by direct DUV laser beam writing

  • Original language description

    A direct writing DUV laser lithography system was used to write surface relief gratings into an organic positive DUV resist and into amorphous chalcogenide layers. For both material groups feature sizes down to 160 nm with aspect ratios of two and more were realised. The nanostructures in chalcogenide layers emerge directly during the writing process, without any development or etching process.

  • Czech name

    Nanostruktura organických a chalcogenidových resistů připravených metodou "direct DUV laser beam writing"

  • Czech description

    "Byly studovány vlastnosti organických a chalkogenidových resistů připravených metodou direct DUV laser beam writing"

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    CA - Inorganic chemistry

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Electronics Letters

  • ISSN

    1350-911X

  • e-ISSN

  • Volume of the periodical

    40

  • Issue of the periodical within the volume

    3

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    2

  • Pages from-to

    1-2

  • UT code for WoS article

  • EID of the result in the Scopus database